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field emission microscopy
Field emission microscopy (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties.〔(【引用サイトリンク】 publisher = Field Emission / Ion Microscopy Laboratory, Purdue University, Dept. of Physics )〕 Invented by Erwin Wilhelm Müller in 1936, the FEM was one of the first surface analysis instruments that approached near-atomic resolution.
==Introduction==
Microscopy techniques are used to produce real space magnified images of a surface showing what it looks like. In general microscopy information concerns surface crystallography (i.e. how the atoms are arranged at the surface), surface morphology (i.e. the shape and size of topographic features making the surface), and surface composition (the elements and compounds the surface is composed of).
Field emission microscopy (FEM) was invented by Erwin Müller in 1936. In FEM, the phenomenon of field electron emission was used to obtain an image on the detector on the basis of the difference in work function of the various crystallographic planes on the surface.
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